Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

Memory-efficient, multithreaded engines utilize available server cores to speed up automatic test pattern generation (ATPG) and silicon diagnosis Twenty-five percent fewer test patterns reduce test ...

Regardless of the test methodology employed, the goal of manufacturing test is to identify, or screen out, defective devices before they are embedded into a system or shipped to the end customer. More ...

TetraMAX II ATPG reduced test generation runtime by an order of magnitude, from an overnight run to less than one hour, while producing 50 percent fewer patterns DecaWave met their silicon test time ...

Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...