Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Neutral helium microscopy and atom optics constitute an innovative imaging paradigm that exploits low-energy, charge-neutral helium atoms to non-destructively investigate surface properties at the ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

Understanding failure modes, mechanisms, and root causes is critical in the manufacturing of semiconductors and electronic devices. Identifying the underlying cause of a failure not only helps prevent ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force microscope, then we look at a real AFM (an nGauge AFM from ICSPI) and do a few ...

A new microscopy technique allows scientists to see single-atom-thick boron nitride by making it glow under infrared light. Researchers from the Physical Chemistry and Theory departments at the Fritz ...

Polymer materials play an increasingly important role in a variety of industrial applications, thanks to their distinct physical and chemical properties. Among their key mechanical characteristics, ...