San Jose, Calif. — Magma Design Automation Inc. has launched the Talus automatic test pattern generation (ATPG) and Talus ATPG-X products with on-chip compression. These advanced ATPG products are ...

Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on integrated circuits continues to double ...

Automatic test pattern generation automatic test pattern generator is an electronic design automation method used to find an input sequence that, when applied to a digital circuit, enables automatic ...

Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.