As semiconductor packages grow more complex, conventional continuity tests are no longer adequate for screening out open circuits and pin-to-pin shorts. Most test methods were designed for devices ...

A test based on the maximum adjusted residual from multinomial models, namely, the M test, is proposed. Sharp bounds on its critical values are provided for the multinomial case, while for the two-way ...

SIFMA issued the following statement from Tom Price, managing director and head of technology, operations and business continuity for SIFMA, on SIFMA’s October 15, 2022 industry-wide business ...