As semiconductor packages grow more complex, conventional continuity tests are no longer adequate for screening out open circuits and pin-to-pin shorts. Most test methods were designed for devices ...

SIFMA issued the following statement from Tom Price, managing director and head of technology, operations and business continuity for SIFMA, on SIFMA’s October 15, 2022 industry-wide business ...

A test based on the maximum adjusted residual from multinomial models, namely, the M test, is proposed. Sharp bounds on its critical values are provided for the multinomial case, while for the two-way ...